Machine Vision and Applications

Editor-in-Chief: Mubarak Shah
Machine Vision and Applications 
ISSN: 0932-8092 (print version)
ISSN: 1432-1769 (electronic version)
Journal no. 138
  • Sponsored by the International Association for Pattern Recognition.
  • Publishes high-quality technical contributions in machine vision research and development.
  • Features coverage of all applications and engineering aspects of image-related computing, including scientific, commercial, industrial, military, and biomedical applications of machine vision.
  • Places particular emphasis on the engineering and technology aspects of image processing and computer vision.
Sponsored by the International Association for Pattern Recognition, this journal publishes high-quality, technical contributions in machine vision research and development. Machine Vision and Applications features coverage of all applications and engineering aspects of image-related computing, including original contributions dealing with scientific, commercial, industrial, military, and biomedical applications of machine vision.
The journal places particular emphasis on the engineering and technology aspects of image processing and computer vision. It includes coverage of the following aspects of machine vision applications: algorithms, architectures, VLSI implementations, AI techniques and expert systems for machine vision, front-END sensing, multidimensional and multisensor machine vision, real-time techniques, image databases, virtual reality and visualization.
Related subjects » Image Processing - Signals & Communication

Impact Factor: 0.952 (2009) * 

* Journal Citation Reports®, Thomson Reuters

Abstracted/Indexed in: 

Academic OneFile, Academic Search, ACM Computing Reviews, ACM Digital Library, Computer Abstracts International Database, Computer Science Index, CSA, Current Abstracts, Current Contents Collections / Electronics & Telecommunications Collection, Current Contents/Engineering, Computing and Technology, DBLP, Earthquake Engineering Abstracts, EBSCO, EI-Compendex, Engineered Materials Abstracts, Gale, Google Scholar, INSPEC, io-port.net, Journal Citation Reports/Science Edition, OCLC, ProQuest, Science Citation Index Expanded (SciSearch), SCOPUS, Summon by Serial Solutions














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